METHOD AND SYSTEM FOR TESTING MATRICES AND METHOD FOR CONTROLLING VOLTAGE CLOCKS
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United States of America Patent
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Issued Date -
Mar 20, 2014
app pub date -
Jan 22, 2013
filing date -
Sep 14, 2012
priority date (Note) -
Abandoned
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Abstract
The present invention discloses method and system for testing matrices and method for controlling voltage clocks, comprising the steps of: providing a matrix circuit comprising a plurality of first end points and a plurality of second end points, wherein there is a path having a switch thereon between each of the first end points and a corresponding one of the second end points; supplying pulse voltages to the first end points or the second end points in accordance with a time sequence, wherein each of the pulse voltages has a given time width and there is no temporal overlap between the pulse voltages; and determining whether or not each of the switches functions properly through simultaneous depressing of more than one of the switches and on the basis of the amounts of time for which respective pulse voltages function at the first end points or the second end points.
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