PROBE HEAD TEST FIXTURE AND METHOD OF USING THE SAME
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Mar 27, 2014
app pub date -
Sep 21, 2012
filing date -
Sep 21, 2012
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
Various probe testing load board structures and methods of using the same are disclosed. In one aspect, a method of testing a load board of a probe testing system is provided. The method includes electrically engaging a shorting substrate with conductor structures of the load board. The shorting substrate is operable to establish one or more electrical pathways between the tester and at least one electronic component of the load board. An electrical test is performed on the at least one electronic component using the one or more electrical pathways.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully