SYSTEM AND METHOD OF DETERMINING A PARAMETER OF A MEASURED ELECTRONIC DEVICE

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United States of America Patent

APP PUB NO 20140088909A1
SERIAL NO

13628594

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Abstract

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The invention provides a method of determining a parameter of a measured electronic device for purposes of programming the device or determining its functionality. A stored reference profile of a reference electronic device includes a respective frequency at each of a plurality of respective temperatures. Heat is simultaneously transferring heat to or from the reference and measured electronic devices while recording a frequency provided by the reference electronic device and a corresponding frequency provided by the measured electronic device at each of a plurality of instances in time. A temperature of the reference electronic device is determined based on the frequency detected for the reference electronic device and the corresponding temperature within the reference profile. The frequency detected from the measured electronic device is then correlated with a temperature the reference electronic device used as the temperature of the measured electronic device.

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Patent Owner(s)

Patent OwnerAddress
EXATRON INC2842 AIELLO DRIVE SAN JOSE CA 95111

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Howell, Robert P San Jose, US 11 52

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