Plasma Etch Resistant Films, Articles Bearing Plasma Etch Resistant Films and Related Methods

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United States of America Patent

APP PUB NO 20140099491A1
SERIAL NO

13647949

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention includes a plasma etch-resistant film for a substrate comprising a yttria material wherein at least a portion of the yttria material is in a crystal phase having a crystal lattice structure, wherein at least 50% of the yttria material is in a form of a monoclinic crystal system. The film may be treated by exposure to a fluorine gas plasma. Also included are plasma etch-resistant articles that include a substrate and a film, wherein the film comprises an yttria material and at least a portion of the yttria material is present in the film in a crystal phase having a crystal lattice structure and at least 50% of the yttria material is in a form of a monoclinic crystal system. Several methods are contemplated within the scope of the invention.

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Patent Owner(s)

Patent OwnerAddress
GREENE TWEED TECHNOLOGIES INC1105 NORTH MARKET STREET SUITE 1300 WILMINGTON DE 19801

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ameen, Mohammed Souderton, US 1 10
Lee, Sang-Ho North Wales, US 190 1813
Mercer, Thomas Annapolis, US 7 40
Vorsa, Vasil Coopersburg, US 13 295

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