Nano-Pipet Fabrication
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United States of America Patent
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app pub date -
Nov 7, 2012
filing date -
Oct 15, 2012
priority date (Note) -
Abandoned
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Abstract
A hollow high aspect ratio sample, such as a nano-test-tube, with a tip that is closed off is secured in a particle beam device, such as a transmission electron microscope. The tip is engaged with the particle beam of the particle beam device until a hole opens up on the tip, thereby turning the high aspect ratio sample into a nano-pipet. Alternatively, a nano-pipet having a hole that does not meet desired parameter values is secured in a particle beam device. The nano-pipet is engaged with the particle beam to attain the desired values of the hole parameters.
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