STAND ALONE MULTI-CELL PROBE CARD FOR AT-SPEED FUNCTIONAL TESTING
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United States of America Patent
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N/A
Issued Date -
May 8, 2014
app pub date -
Oct 19, 2013
filing date -
Nov 5, 2012
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A probe card includes at least two connection arrangements on a printed circuit board and a daughter board connected to the printed circuit board through one of the connection arrangements. The daughter board includes a plurality of cell modules, with each of the cell modules having a socket for receiving a device under test and each of the connection arrangements of the printed circuit board being connectable to each of predetermined daughter boards respectively.
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