RESIST COMPOSITION FOR NEGATIVE DEVELOPMENT WHICH IS USED FOR FORMATION OF GUIDE PATTERN, GUIDE PATTERN FORMATION METHOD, AND METHOD FOR FORMING PATTERN ON LAYER CONTAINING BLOCK COPOLYMER

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United States of America Patent

APP PUB NO 20140127626A1
SERIAL NO

13877563

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Abstract

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A negative tone-development resist composition for forming a guide pattern, including a base component (A) and an acid generator component (B), the base component (A) including a resin component (A1) having a structural unit (a1) derived from an acrylate ester containing an acid dissociable group, and at least one of the following structural units (a2): a structural unit derived from an acrylic acid ester containing a lactone-containing cyclic group, a structural unit derived from an acrylic acid ester containing an ether-containing cyclic group and a structural unit derived from an acrylic acid ester containing a carbonate-containing cyclic group, and a constituent unit (a1) derived from an acrylic acid ester containing an acid-labile group, the acid generator component (B) including an acid generator (B1) including at least one compound represented by general formula (b1) or (b2) shown below

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Patent Owner(s)

Patent OwnerAddress
TOKYO OHKA KOGYO CO LTDKANAGAWA
RIKENWAKO-SHI SAITAMA 351-0198

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dazai, Takahiro Kawasaki-shi, JP 73 876
Fujikawa, Shigenori Fukuoka-shi, JP 22 172
Hayakawa, Harumi Wako-shi, JP 6 67
Koizumi, Mari Wako-shi, JP 6 107
Miyagi, Ken Kawasaki-shi, JP 69 670
Senzaki, Takahiro Kawasaki-shi, JP 48 183

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