Charge Trapping Device with Improved Select Gate to Memory Gate Isoloation

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United States of America Patent

APP PUB NO 20140167136A1
SERIAL NO

13715729

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Abstract

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Embodiments described herein generally relate to charge-trapping memory with improved isolation between a select gate and a memory gate. The isolation is improved because the charge trapping layer is not present in the junction between the select gate and the memory gate. The methods described herein additionally allow insulation to be disposed between the select gate and the memory gate.

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Patent Owner(s)

Patent OwnerAddress
CYPRESS SEMICONDUCTOR CORPORATION198 CHAMPION COURT SAN JOSE CA 95134-1709

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pak, James Sunnyvale, US 21 145
RAMSBEY, Mark Sunnyvale, US 49 567

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