SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD

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United States of America Patent

APP PUB NO 20140167210A1
SERIAL NO

13897360

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Abstract

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Various embodiments provide a semiconductor structure and fabrication method. An exemplary semiconductor structure can include a semiconductor substrate having an isolation trench formed in the semiconductor substrate. A first barrier layer can be disposed on a bottom surface and a sidewall of the isolation trench. A light absorption layer can be disposed at least on a surface portion of the first barrier layer over the bottom surface of the isolation trench. A second barrier layer can fill the isolation trench to form an isolation structure in the semiconductor substrate. The isolation structure can have a top surface flushed with or over a top surface of the semiconductor substrate.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR MANUFACTURING INTERNATIONAL CORP18 ZHANGJIANG ROAD PUDONG NEW AREA SHANGHAI 201203

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HU, DANIEL Shanghai, CN 21 361

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