METHOD FOR INSPECTING DEFECTS OF OPTICAL LAYER ELEMENTS OF A DISPLAY DEVICE
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United States of America Patent
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Issued Date -
Jun 19, 2014
app pub date -
Mar 21, 2013
filing date -
Dec 17, 2012
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Disclosed is a method for inspecting defects of optical layer elements of a display device. The method includes steps of: scanning a selected optical layer element of the display device by a scanning light beam at a predetermined scan angle, wherein the optical layer element is selected from a polarizing layer, a filter layer, an alignment layer, a liquid crystal layer, a thin film transistor substrate layer, a light diffusion layer, a light guide layer, or a combination thereof; retrieving a light pattern generated by scanning the selected optical layer element; generating an inspecting result information according to the light pattern in relation to the selected optical layer element; and analyzing the optical layer element regarding defect conditions according to the inspecting result information.
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