ANALYSIS OF CHIP-MEAN VARIATION AND INDEPENDENT INTRA-DIE VARIATION FOR CHIP YIELD DETERMINATION
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United States of America Patent
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Issued Date -
Jun 19, 2014
app pub date -
Dec 17, 2012
filing date -
Dec 17, 2012
priority date (Note) -
Abandoned
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Abstract
Systems and methods for determining a chip yield are disclosed. One method includes obtaining a first probability distribution function modeling variations within a chip and a second probability distribution function modeling variations between dies. Further, a discontinuous first level integration is performed with the first probability distribution function and a continuous second level integration is performed by a hardware processor based on the second probability function to determine the chip yield.
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