Measuring Method And System For Measuring Positions Of Elements Of A Structure
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United States of America Patent
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Issued Date -
Jun 26, 2014
app pub date -
Dec 20, 2013
filing date -
Dec 20, 2012
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A method for measuring a position of an element of a structure includes the steps of: attaching a receiving device to the element at a measurement position; attaching a first reference device to the receiving device; determining a first measurement point with a first measurement device adapted to measure a position of the first reference device; removing the first reference device; attaching a second reference device to the receiving device; and determining a second measurement point with a second measurement device adapted to measure a position of the second reference device.
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