Reflection characteristic measuring apparatus
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United States of America Patent
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Mar 10, 2015
Grant Date -
Jun 26, 2014
app pub date -
Dec 23, 2013
filing date -
Dec 25, 2012
priority date (Note) -
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Abstract
A measuring apparatus includes an illumination device including a surface light source, a detector configured to detect a light intensity distribution formed on a light-receiving surface by reflected light, and a processor configured to obtain the reflection characteristic based on first data of the light intensity distribution detected by the detector. The processor is configured to estimate, based on the first data, second data of a light intensity distribution formed by specular reflected light and third data of a light intensity distribution formed by diffuse reflected light in a case where a point light source is disposed at each position in a light-emitting region of the surface light source, and to estimate, based on the second data and the third data, a light intensity distribution formed by reflected light from the surface.
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