For test (DFT) read speed through transition detector in built-in self-test (BIST) sort

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8964484
APP PUB NO 20140185393A1
SERIAL NO

13729153

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A memory operate in a normal mode of operation or a testing mode of operation. In the testing mode of operation, the memory can measure various benchmarks of performance, such as read speed. The memory can perform an asynchronous read operation to read a word of electronic data that corresponds to an address or a page read operation in which multiple asynchronous read operations are performed to read multiple words of electronic data, also referred to as a page of electronic data, that correspond to multiple addresses. The memory can measure a time required, referred to as read speed, to read the word of electronic data or the multiple words of electronic data from the memory. In the normal mode of operation, the memory can perform the asynchronous read operation, the page read operation, an asynchronous write operation in which a word of electronic data is stored into the memory that correspond to the address, or a page write operation in which a page electronic data is stored into the memory that correspond to the multiple addresses.

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Patent Owner(s)

  • SPANSION LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beh, Jih Hong Bukit Mertajam, MY 2 4
Ch'ng, Sheau-Yang Penang, MY 4 8
Lau, Sie Wei Henry Bayan Lepas, MY 1 2
Ong, Mee-Choo Batu Maung, MY 4 5
Ong, Wei-Kent Bayan Lepas, MY 4 6
Teoh, Boon-Weng Bayan Lepas, MY 1 2

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