Goods inspection apparatus using distributed X-ray source

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United States of America Patent

PATENT NO 9341736
APP PUB NO 20140185754A1
SERIAL NO

14134845

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Abstract

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This invention relates to an X-ray goods inspection apparatus, and in particular to a goods inspection apparatus using distributed X-ray source.

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Patent Owner(s)

  • NUCTECH COMPANY LIMITED;TSINGHUA UNIVERSITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Li, Yuanjing Beijing, CN 271 1894
Liu, Yaohong Beijing, CN 106 542
Qin, Zhanfeng Beijing, CN 12 112
Tang, Hu Beijing, CN 27 108
Tang, Huaping Beijing, CN 34 214
Zhang, Jinyu Beijing, CN 75 218
Zhao, Ziran Beijing, CN 240 1234

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