Dual-imprint pattern for apparatus

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United States of America Patent

SERIAL NO

14160220

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Abstract

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Provided herein is an apparatus, including an imprint template including a dual-imprint pattern, wherein the dual-imprint pattern is characteristic of imprinting a first pattern on the template with a first template and a second pattern on the template with a second template, and wherein the first pattern and the second pattern at least partially overlap to form the dual-imprint pattern.

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Patent Owner(s)

Patent OwnerAddress
SEAGATE TECHNOLOGY LLCCUPERTINO CA 95014

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kuo, David S Palo Alto, US 99 357
Lee, Kim Y Fremont, US 71 428
Lee, Shih-fu Fremont, US 17 98
Wago, Koichi Sunnyvale, US 71 887
Weller, Dieter K San Jose, US 45 525
Yen, Bing K Cupertino, US 42 729

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