ADC testing

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United States of America Patent

PATENT NO 9106247
APP PUB NO 20140203954A1
SERIAL NO

14174334

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Abstract

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A histogram-based method for testing an electronic converter device, such as an analogue to digital converter, includes steps of defining at least one histogram hyperbin arranged to store hits for at least one subrange of output codes; applying an input test stimulus to an input of the device to test a subrange of output codes matched to the hyperbin; and accumulating the histogram. At least two hyperbins may be provided, each bin being arranged to store hits for at least one subrange of output codes, and the input test stimulus is applied to an input of the device to test a subrange of output codes matched to one of the hyperbins. Both hyperbins may be open while the histogram is being accumulated for any subrange of output codes. The method may further involve varying the input stimulus to test another subrange.

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Patent Owner(s)

  • ATEEDA LTD.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hamilton, David Edinburgh, GB 75 676
Sharp, Gordon Edinburgh, GB 12 114

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