TEMPLATE, MANUFACTURING METHOD OF THE TEMPLATE, AND STRAIN MEASURING METHOD IN THE TEMPLATE

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United States of America Patent

APP PUB NO 20140209567A1
SERIAL NO

13920268

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Abstract

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According to one embodiment, provided is a template including a first pattern that is to be transferred to a processing target and is arranged on a transfer region defined on a first principal surface of a template substrate. The template includes a second pattern that is used to measure a position and arranged on a second principal surface of the template substrate opposite to the first principal surface.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBAMINATO-KU TOKYO 105-0023

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KOBAYASHI, Yuji Mie, JP 260 2314
SATO, Hidenori Kanagawa, JP 111 1084

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