Classifying bit errors in transmitted run length limited data

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United States of America Patent

PATENT NO 9021325
APP PUB NO 20140223270A1
SERIAL NO

13761427

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Abstract

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A test pattern is encoded using a run length limited line encoding to produce an encoded block of data. The encoded block of data is sent via a channel. A plurality of bits in the received block of data that are subsequent to a maximum length run in the sent data is compared to an expected plurality of bits. A type of bit error is classified based on a mismatch between the expected plurality of bits and the plurality of bits in the received block of data.

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Patent Owner(s)

  • AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gauvin, Coralyn S Colorado Springs, US 12 98
Romero, Gabriel L Colorado Springs, US 14 92

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