AlGaN TEMPLATE FABRICATION METHOD AND STRUCTURE OF THE AlGaN TEMPLATE

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United States of America Patent

APP PUB NO 20140225121A1
SERIAL NO

14143716

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Provided are an aluminum gallium nitride template and a fabrication method thereof. The fabrication method includes forming an aluminum nitride (AlN) layer on a substrate, forming a first aluminum gallium nitride (AlxGa1-xN) layer on the aluminum nitride (AlN) layer, forming a second aluminum gallium nitride (AlyGa1-yN) layer on the first aluminum gallium nitride (AlxGa1-xN) layer, forming a third aluminum gallium nitride (AlzGa1-zN) layer on the second aluminum gallium nitride (AlyGal-yN) layer, wherein the first aluminum gallium nitride (AlxGa1-xN) layer, the second aluminum gallium nitride (AlyGa1-yN) layer, and the third aluminum gallium nitride (AlzGa1-zN) layer are formed to have crystal defects and a composition ratio of aluminum (where 1>x>y>z>0) that are gradually decreased as heights of the layers are increased.

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ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTEDAEJEON 305-700

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Inventor Name Address # of filed Patents Total Citations
BAE, Sung-Bum Daejeon, KR 17 69
KIM, Sung Bock Daejeon, KR 34 132
NAM, Eun Soo Daejeon, KR 89 500

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