PLANAR STRUCTURE CHARACTERISTICS OBTAINED WITH LOOK UP TABLES
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United States of America Patent
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Issued Date -
Aug 21, 2014
app pub date -
Feb 19, 2013
filing date -
Feb 19, 2013
priority date (Note) -
Abandoned
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Abstract
A system including a computing device to compare a first measured characteristic of a planar structure to a first look up table and obtain the relative permittivity of the planar structure based on the comparison of the first measured characteristic. The computing device compares a second measured characteristic of the planar structure to a second look up table to obtain the tangential loss of the planar structure based on the comparison of the second measured characteristic.
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