COVERAGE MODEL AND MEASUREMENTS FOR PARTIAL INSTRUMENTATION
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United States of America Patent
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Aug 21, 2014
app pub date -
Feb 20, 2013
filing date -
Feb 20, 2013
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Abstract
A computer implemented method, an apparatus and a computer program product for instrumentation coverage. The method comprising: determining an instrumentation coverage model of a system having components, the instrumentation coverage model defining instrumentation tasks of the system, wherein each instrumentation task defines a subset of the components to be monitored; and monitoring the system by a computer, wherein during said monitoring applying a plurality of partial instrumentation tasks defining strict subsets of the components to be monitored.
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