TEST CONTROL USING EXISTING IC CHIP PINS

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United States of America Patent

APP PUB NO 20140237308A1
SERIAL NO

14185829

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An apparatus and method are provided for testing normal circuitry in an integrated circuit, the method including writing test protocols into a plurality of test registers using an enable pin and a switch pin in a first mode, storing a logic high signal in one of the plurality of test registers once the writing is completed, switching from the first mode to a second mode if the one of the plurality of test registers stores the logic high signal, and testing the normal circuitry using the enable pin and the switch pin in the second mode.

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Patent Owner(s)

Patent OwnerAddress
FAIRCHILD SEMICONDUCTOR CORPORATION5005 E MCDOWELL ROAD MAILDROP A700 PHOENIX AS 85008

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kujala, Juha-Matti Kokkola, FI 6 19

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