Semiconductor storage device and method of manufacturing the same

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 9082866
APP PUB NO 20140239368A1
SERIAL NO

14018750

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Abstract

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A semiconductor device including a first isolation region dividing a semiconductor substrate into first regions; memory cells each including a tunnel insulating film, a charge storing layer, an interelectrode insulating film, and a control gate electrode above the first region; a second isolation region dividing the substrate into second regions in a peripheral circuit region; and a peripheral circuit transistor including a gate insulating film and a gate electrode above the second region. The first isolation region includes a first trench, a first element isolation insulating film filled in a bottom portion of the first trench, and a first gap formed between the first element isolation insulating film and the interelectrode insulating film. The second isolation region includes a second trench and a second element isolation insulating film filled in the second trench. The first and the second element isolation insulating films have different properties.

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Patent Owner(s)

  • TOSHIBA MEMORY CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujii, Yoshihisa Yokkaichi, JP 45 748
Kai, Naoki Kuwana, JP 21 120
Matsuno, Koichi Mie-gun, JP 69 255
Sakaguchi, Takeshi Yokkaichi, JP 47 423
Sotome, Shinichi Yokkaichi, JP 18 63
Sugiyama, Hirokazu Mie-gun, JP 34 110
Watanabe, Tadayoshi Tsukuba, JP 16 126

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