FERROELECTRIC MEMORY DEVICE

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United States of America Patent

APP PUB NO 20140264271A1
SERIAL NO

13845366

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Abstract

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A ferroelectric memory device includes a memory layer, made of a silicon-based ferroelectric memory material. The silicon-based ferroelectric memory material includes a mesoporous silica film with nanopores and atomic polar structures on inner walls of the nanopores. The atomic polar structures are formed by asymmetrically bonding metal ions to silicon-oxygen atoms on the inner walls, and the silicon-based ferroelectric memory material includes semiconductor quantum dots, metal quantum dots and metal-semiconductor alloy quantum dots.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL APPLIED RESEARCH LABORATORIES7F NO 26 PROSPERITY RD 1 SCIENCE PARK HSINCHU 300

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Wen-Hsien Hsinchu, TW 17 58
Kuo, Hao-Chung Hsinchu, TW 77 349
Lien, Yu-Chung Taoyuan County, TW 121 143
Pan, Fu-Ming Hsinchu, TW 6 8
Shen, Chang-Hong Hsinchu, TW 10 50
Shieh, Jia-Min Hsinchu, TW 20 120

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