Electronic emulation of material impedance for standardization and calibration of electromagnetic measuring device
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United States of America Patent
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Oct 31, 2017
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app pub date -
Mar 12, 2014
filing date -
Mar 14, 2013
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Abstract
Apparatuses, systems, methods, and computer program products are presented for electronically emulating the impedance characteristics of materials, e.g., for standardizing and calibrating electromagnetic measuring devices for the measurement of physical properties of materials. The electronic impedance emulation apparatus according to some embodiments includes an electronic material emulation circuit in communication with the electromagnetic measuring device. The electronic material emulation circuit and the electromagnetic measuring device are controlled by a at least one computing device, which can control the frequency of signal(s) generated by the electromagnetic measuring device. The at least one computing device can instruct the electronic emulator to produce signals having complex impedance characteristics of the material under test at the test frequency. The emulation data can be stored and used for the calibration and/or standardization of the electromagnetic measuring device.
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