Image recognition base ablation pattern position recall
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United States of America Patent
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Jul 17, 2018
Grant Date -
Sep 25, 2014
app pub date -
Mar 14, 2014
filing date -
Mar 15, 2013
priority date (Note) -
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Abstract
Embodiments of the present invention exemplarily described herein relate generally to saving XYZ stage coordinates for intended laser locations as well as a kernel image of an ablation pattern placed during a scan placement process, and comparing the kernel image to a current image of the current field of view of a camera/microscope that includes the location a laser would be fired at. This comparison is used during an experimental run to correct for any built up error. More particularly, embodiments of the present invention relate to apparatuses and methods for software based image recognition to correct errors in open looped systems for positioning a sample relative to a laser in analysis systems for zircon crystal grain dating.
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