Scan chain processing in a partially functional chip

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United States of America Patent

PATENT NO 9575120
APP PUB NO 20140298124A1
SERIAL NO

13853592

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Abstract

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A method for scanning a partially functional chip. The method may include applying a failed core map to the partially functional chip, bypassing at least one failed core scan chain, based on contents of the failed core map. The method may also include performing comparisons of scan status information to the failed core map and inhibiting movement of scan data of at least one failed core, based on results of the comparisons.

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Patent Owner(s)

  • INTERNATIONAL BUSINESS MACHINES CORPORATION

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Douskey, Steven M Rochester, US 63 258
Fuhs, Ronald E Rochester, US 16 342

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