Surface potential distribution measuring device and surface potential distribution measuring method

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United States of America Patent

PATENT NO 9702915
APP PUB NO 20140300368A1
SERIAL NO

14355760

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In a surface potential distribution measuring device for an electric field reduction system of a rotating electrical machine, a Pockels crystal is used between a laser and the surface (test location) of the electric field reduction system. Light intensity of a laser beam reflected on a mirror provided between the Pockels crystal and the test location corresponds to an output voltage that is the voltage difference between the first end surface and the second end surface of the Pockels crystal. Even when an inverter voltage is generated, by using a light detector having a frequency band capable of following the high frequency components of the inverter pulse voltage, the light intensity is detected by the light detector. Therefore, from the light intensity (output voltage), the surface potential distribution measuring device can measure the surface potential of the electric field reduction system in which an inverter pulse voltage is generated.

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Patent Owner(s)

  • THE UNIVERSITY OF TOKYO;TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hidaka, Kunihiko Tokyo, JP 13 130
Ikeda, Hisatoshi Tokyo, JP 11 67
Kumada, Akiko Tokyo, JP 4 11
Tsuboi, Yuichi Tokyo, JP 15 19
Yamada, Shinichiro Tokyo, JP 90 758
Yoshimitsu, Tetsuo Tokyo, JP 18 61

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