Scan compression ratio based on fault density
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United States of America Patent
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Jun 16, 2015
Grant Date -
Oct 16, 2014
app pub date -
Apr 12, 2013
filing date -
Apr 12, 2013
priority date (Note) -
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Abstract
A processor-implemented method for determining scan compression ratio based on fault density. The processor-implemented method may include calculating, by a processor, a fault density value for each of a plurality of partitions of an integrated circuit. The fault density is computed by the processor based on a ratio of a total number of faults per partition to a total number of flip-flops per partition. The processor-implemented method further includes the processor determining a compression ratio for each of the plurality of partitions based on the fault density value for each of the plurality of partitions and applying the compression ratio to each of the plurality of the partitions of the integrated circuit.
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