Methods and apparatuses for measuring effective atomic number of an object

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United States of America Patent

PATENT NO 9464997
APP PUB NO 20140314201A1
SERIAL NO

14129669

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Abstract

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Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.

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Patent Owner(s)

  • NUCTECH COMPANY LIMITED;TSINGHUA UNIVERSITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Zhiqiang Beijing, CN 400 2409
Li, Shuwei Beijing, CN 28 645
Li, Yuanjing Beijing, CN 271 1884
Liu, Yinong Beijing, CN 148 1440
Wang, Yi Beijing, CN 1224 12947
Zhang, Qingjun Beijing, CN 96 346
Zhang, Wenjian Beijing, CN 26 169
Zhao, Shuqing Beijing, CN 7 122
Zhao, Ziran Beijing, CN 240 1215
Zhu, Weibin Beijing, CN 19 184

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