Measurement by means of atom interferometry

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United States of America Patent

PATENT NO 9046368
APP PUB NO 20140319329A1
SERIAL NO

14365855

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Abstract

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The invention relates to a measurement by means of atom interferometry, using a Raman source that is created by modulating a monochromatic laser source. By conveniently selecting positions in which interactions between atoms and a laser radiation, produced by the Raman source, are caused, it is possible to eliminate or at least reduce a measurement bias caused by supplementary components of the laser radiation. Such a measurement having eliminated or reduced bias can be used in an inertia sensor.

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Patent Owner(s)

  • ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES)

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bidel, Yannick Palaiseau, FR 5 15
Bresson, Alexandre Palaiseau, FR 5 15
Zahzam, Nassim Palaiseau, FR 5 15

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