METHOD OF MEASURING NARROW RECESSED FEATURES USING MACHINE VISION

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20140340507A1
SERIAL NO

14277502

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

Deep narrow gaps (20) between side walls (32 and 36) of a workpiece (26) can be measure by modules (42) that include an imager (70) and provide focused directional lighting from light sources (76) into the gaps (20). The imager (70) may employ a camera having an array of pixels along rows and columns. Gray scale captured by pixels along rows or columns parallel to a major axis (46) of the gap (20) may be analyzed to facilitate determination of spacing between the edges (34 and 38) of the gaps (20). Relative movement between the workpiece (26) and the imager (76) along the major axis (46) can also facilitate determination of spacing between the edges (34 and 38) of the gaps (20).

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
ELECTRO SCIENTIFIC INDUSTRIES INC13900 NW SCIENCE PARK DRIVE PORLTLAND OR 97229

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KIM, Kyung Young Portland, US 12 41

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation