METHOD AND APPARATUS FOR MEASUREMENT AND CONTROL OF PROCESS PARAMETERS
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United States of America Patent
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Issued Date -
Dec 4, 2014
app pub date -
May 27, 2014
filing date -
May 28, 2013
priority date (Note) -
Abandoned
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Abstract
A method and apparatus for measurement and control of parameters are described. The method comprises the steps of: taking a sample from each of a plurality of samplings points in a controlled sequence, the sample having a sample volume; transferring the sample volume to an instrument measurement cell according to the controlled sequence the instrument measurement cell comprising at least one instrument, and a casing having a cell volume, wherein the at least one instrument measures a value of at least one process parameter of the sample volume, and logging and/or transmitting the value of the at least one process parameter of the sample volume. The apparatus comprises: a plurality of fluid transporters, an instrument measurement cell comprising a casing having a cell volume; and at least one instrument within the casing; a manifold fluidly connected between the plurality of fluid transporters and the instrument measurement cell, and an apparatus controller.
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