MATERIAL ANALYSIS SYSTEM, METHOD AND DEVICE
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United States of America Patent
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Dec 11, 2014
app pub date -
Nov 30, 2012
filing date -
Dec 2, 2011
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Abstract
The invention relates to a system and method of analysing material as well as to an apparatus for analysing material, particularly, though not necessarily exclusively, biomaterial. The invention entails receiving holographic intensity data comprising at least a holographic intensity pattern associated with a sample of the material of interest and processing, by applying image processing algorithms and techniques, the received holographic intensity data at least to perform one or both steps of detecting and identifying at least one object of interest in the sample thereby at least to generate a suitable output.
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