Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images

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United States of America Patent

PATENT NO 9081030
APP PUB NO 20140366229A1
SERIAL NO

14299170

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Abstract

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A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position.

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Patent Owner(s)

  • KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kim, Yong-Hyun Daejeon, KR 44 257
Lee, Eui-Sup Daejeon, KR 2 3
Lyeo, Ho-Ki Daejeon, KR 2 3

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