MANUFACTURING ADVANCED TEST PROBES

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United States of America Patent

SERIAL NO

13977665

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Abstract

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Embodiments relate to the formation of test probes. One method includes providing a bulk sheet of an electrically conductive material. A laser is used to cut through the bulk sheet in a predetermined pattern to form a test probe. Other embodiments are described and claimed.

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Patent Owner(s)

Patent OwnerAddress
INTEL CORPORATION2200 MISSION COLLEGE BOULEVARD SANTA CLARA CA 95054

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fischer, Paul B Portland, US 94 391
Kwong, Charlotte C Aloha, US 3 7
Swart, Roy E Hillsboro, US 9 28

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