CIRCUIT LIFETIME MEASURING DEVICE AND METHOD

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United States of America Patent

APP PUB NO 20150035555A1
SERIAL NO

14330250

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention discloses a circuit lifetime measuring device to estimate the rest lifetime of a target circuit, comprising: a reference clock receiving end for receiving a reference clock; a correlation signal generating circuit for providing a correlation signal in which at least some operating settings of the correlation signal generating circuit and the target circuit vary synchronously; a storage circuit for storing an initial relation between the reference clock and the correlation signal; a measuring circuit, coupled to the reference clock receiving end and the correlation signal generating circuit, for measuring a present relation between the reference clock and the correlation signal; and an estimating circuit, coupled to the storage circuit and the measuring circuit, for generating an estimation value according to the initial relation and the present relation, wherein the estimation value indicates the rest lifetime of the target circuit.

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Patent Owner(s)

Patent OwnerAddress
REALTEK SEMICONDUCTOR CORPORATIONNO 2 INNOVATION ROAD II HSINCHU SCIENCE PARK HSINCHU 300

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jean, Yuh-Sheng Hsinchu, TW 57 148
Weng, Chi-Shun Hsinchu, TW 24 79
Yeh, Ta-Hsun Hsinchu, TW 79 354

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