Measurement correction apparatus, methods, and systems
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United States of America Patent
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May 28, 2019
Grant Date -
Feb 5, 2015
app pub date -
Dec 31, 2012
filing date -
Dec 31, 2012
priority date (Note) -
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status (Latency Note)
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Abstract
In some embodiments, an apparatus and a system, as well as a method and an article, may operate to calculate a map that transforms fast modeled measurement results into accurate modeled measurement results within a modeled data space, to make actual measurements using a tool disposed in a borehole, to transform a plurality of modeling parameter vectors into the fast modeled measurement results via modeling, to transform the fast modeled measurement results into the accurate modeled measurement results using the map, to locate a matching modeling parameter vector as one of the plurality of modeling parameter vectors that matches the accurate modeled measurement results to the actual measurement, and to display at least a portion of the matching modeling parameter vector to represent at least one property of a geological formation. Additional apparatus, systems, and methods are described.
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