Failure Rate Estimation From Multiple Failure Mechanisms

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United States of America Patent

APP PUB NO 20150039244A1
SERIAL NO

14338358

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Abstract

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A computerized method for estimating reliability of a system at normal operating conditions. The computerized method includes enables of selection of a plurality of failure mechanisms FMj of the system. The failure mechanisms FMj are estimated to cause failures as time events during use of the system. The failure mechanisms FMj are modeled by respective failure rate models. Failure rates are represented as matrix elements λij which include respective adjustable parameters intrinsic to the failure rate models. Multiple test conditions TCiare selected to accelerate the failure mechanisms FMj. Batches i of the systems are tested during accelerated failure rate tests at the test conditions TCi respectively.

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Patent Owner(s)

Patent OwnerAddress
ARIEL - UNIVERSITY RESEARCH AND DEVELOPEMENT COMPANY LTDPO BOX 3 ARIEL 40700

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bernstein, Joseph Hashmonaim, IL 12 518

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