SOLID-STATE IMAGING DEVICE
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United States of America Patent
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N/A
Issued Date -
Feb 12, 2015
app pub date -
Mar 7, 2014
filing date -
Aug 12, 2013
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
According to one embodiment, a solid-state imaging device including a semiconductor substrate having a light receiving portion, a color filter layer and a selective reflection layer. The color filter layer includes a color filter portion and is provided above a first main surface of the semiconductor substrate. The color filter portion has a transmission band for transmitting light of a predetermined wavelength band and absorbs light outside the transmission band. The selective reflection layer is provided between the first main surface of the semiconductor substrate and the color filter layer so as to contact with the color filter portion. The selective reflection layer has substantially the same refraction index as the color filter portion with respect to light within the transmission band. The refraction index of the selective reflection layer is substantially different from that of the color filter portion with respect to light outside the transmission band.
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