Anti-counterfeiting opto-thermal watermark for electronics
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United States of America Patent
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Mar 29, 2016
Grant Date -
Mar 5, 2015
app pub date -
Dec 11, 2013
filing date -
Aug 30, 2013
priority date (Note) -
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Abstract
An anti-counterfeiting technique presents, to a test thermoreflective mark at a first temperature, a first electromagnetic wave. A first test reflective profile for the test thermoreflective mark associated with the first temperature is recorded. A second electromagnetic wave is presented to the test thermoreflective mark at a second temperature. A second test reflective profile for the test thermoreflective mark associated with the second temperature is recorded. The first test reflective profile is compared with a first control reflective profile that is associated with a genuine thermoreflective mark. The second test reflective profile is compared with a second control reflective profile that is associated with the genuine thermoreflective mark.
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