Semiconductor device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 9263115
APP PUB NO 20150063020A1
SERIAL NO

14476433

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Abstract

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A method includes measuring a first pulse width of a resistance variable memory cell coupled between a first terminal and a second terminal, the first pulse width including a period from starting a first data writing of the resistance variable memory cell by applying a voltage between the first and second terminals to ending the first data writing of the resistance variable memory cell, and measuring a second pulse width of the resistance variable memory cell coupled between the first and the second terminal. The method includes setting longer one of the first and second pulse widths in a first storage area as a pulse width to be used in program.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kajigaya, Kazuhiko Tokyo, JP 257 3595

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