AUTOMATIC RETEST METHOD FOR SYSTEM-LEVEL IC TEST EQUIPMENT AND IC TEST EQUIPMENT USING SAME
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United States of America Patent
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Issued Date -
Mar 5, 2015
app pub date -
Apr 25, 2014
filing date -
Aug 30, 2013
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Abstract
An automatic retest method for a system-level IC test equipment and the IC test equipment is disclosed, wherein the IC test equipment includes multiple testing units, a loading/unloading unit, and a processing unit; each testing unit is capable of testing an IC individually and has a pass rate. When the testing unit finishes a test operation, it will send test report of the IC to the processing unit. The processing unit will determine whether the IC has reached a pass threshold of the testing unit. The processing unit will issue a command, according to a predetermined rule, to transfer the IC that failed to reach the pass threshold to one of the testing units conforming to the predetermined rule to conduct a retest operation. Finally, the processing unit will confirm whether the IC that failed to reach the pass threshold has reached the pass threshold in the retest operation.
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