Atom Interferometry Device for Differential Inertial Measurement
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United States of America Patent
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Apr 2, 2015
app pub date -
Mar 27, 2013
filing date -
Mar 28, 2012
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Abstract
An atom interferometer with differential inertial measurement comprises an atom source system to supply several sets of atoms intended for acceleration measurements which are made simultaneously at different respective locations. The sets of atoms are transported by a dedicated system between an initial position and the locations at which the acceleration measurements are made. The interferometer can be used to obtain highly accurate acceleration or gravity gradient measurement results.
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