Methods of measuring a characteristic of a creping adhesive film and methods of modifying the creping adhesive film

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United States of America Patent

PATENT NO 9182271
APP PUB NO 20150101410A1
SERIAL NO

14575216

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Abstract

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Described herein are quartz crystal microbalance (QCM) and quartz crystal microbalance with dissipation (QCMD) techniques that can be used for measuring characteristics of a creping adhesive film similar to the creping adhesive film that is formed on a Yankee dryer during the tissue and towel manufacturing process. In addition, exemplary embodiments described herein may use these techniques to predict performance of creping aids utilized to form a creping adhesive film.

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Patent Owner(s)

  • KEMIRA OYJ

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Grigoriev, Vladimir Atlanta, US 19 187
Lu, Chen Marietta, US 134 669
Nguyen, Danny Norcross, US 14 107
Rosencrance, Scott Douglasville, US 33 238

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