Systems and methods for sample analysis

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United States of America Patent

PATENT NO 9165752
APP PUB NO 20150102218A1
SERIAL NO

14566838

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Abstract

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The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.

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Patent Owner(s)

  • PURDUE RESEARCH FOUNDATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cooks, Robert Graham West Lafayette, US 175 3566
Li, Guangtao Carmel, US 10 188
Li, Xin West Lafayette, US 834 6328
Ouyang, Zheng West Lafayette, US 96 2804

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