Parameter adjustment for pattern discovery

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United States of America Patent

PATENT NO 10027686
APP PUB NO 20150106922A1
SERIAL NO

14398017

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Abstract

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Pattern discovery performed on event data may include selecting an initial set of parameters for the pattern discovery. The parameters may specify conditions for identifying a pattern in the event data. A pattern discovery run is executed on the event data based on the initial set of parameters, and a parameter may be adjusted based on the output of the pattern discovery run.

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Patent Owner(s)

  • ENTIT SOFTWARE LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Singla, Anurag Cupertino, US 38 1018
Wang, Yanlin San Jose, US 18 112
Zhao, Zhipeng Sunnyvale, US 19 89

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