CONTINUOUS WEB INLINE TESTING APPARATUS, DEFECT MAPPING SYSTEM AND RELATED METHODS
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United States of America Patent
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Issued Date -
Apr 30, 2015
app pub date -
Oct 23, 2014
filing date -
Oct 25, 2013
priority date (Note) -
Abandoned
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Abstract
In at least selected embodiments, an industrial size continuous Hipot testing system has defect mapping capability capable of finding pinholes, weak spots, and/or embedded conductive particles in non-conductive sheet materials. Continuous testing is made possible through a pair of uniquely designed rollers, such as conductive polymer rollers. Automatic defect mapping is also incorporated into the system through the integration of the Hipot testing and line scan camera systems. The unit potentially has wide applications in many industries, such as, for example, semi-conductors and electronics, medical, high end packaging, and so forth.
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