Optimization of integrated circuit reliability

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United States of America Patent

PATENT NO 9395403
SERIAL NO

14064337

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Abstract

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A per-chip equivalent oxide thickness (EOT) circuit sensor resides in an integrated circuit. The per-chip EOT circuit sensor determines electrical characteristics of the integrated circuit. The measured electrical characteristics include leakage current. The determined electrical characteristics are used to determine physical attributes of the integrated circuit. The physical attributes, including EOT, are used in a reliability model to predict per-chip failure rate.

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Patent Owner(s)

  • INTERNATIONAL BUSINESS MACHINES CORPORATION

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Graas, Carole D Jericho, US 23 149
Habib, Nazmul Colchester, US 65 436
Massey, Deborah M Jericho, US 14 75
Massey, John G Jericho, US 15 44
Nsame, Pascal A Essex Junction, US 36 261
Wu, Ernest Y Essex Junction, US 31 84
Yashchin, Emmanuel Yorktown Heights, US 51 728

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